PPT Slide
1 Primary radiation released & directed at sample
2 Primary x-ray causes ejection of electron from atom in sample
3 Characteristic x-ray energy released as outer shell electron fills void
4 X-ray detector in instrument converts characteristic x-ray to electrical pulse
5 Signal from detector is amplified and sent to microprocessor, for counting and processing
6 Element intensity data is processed into element composition data, and resulting values are used to determine alloy grade from internal grade library
7 Alloy composition data & grade identification is displayed on screen for user
8 Measurement data is stored in instrument memory for later recall or download to PC
Operation of NITON FPXRF Analyser